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1. Committee reports for the ... National Conference on Weights and Measures / National Conference on Weights and Measures, Inc. [and] U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology |
| Resource type: serial |
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Subject: Weights and measures -- United States -- Congresses; Weights and measures -- Congresses |
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 http://purl.access.gpo.gov/GPO/LPS4343 |
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Antpac Record
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2. Dictionary of weighing terms a guide to the terminology of weighing / Roland Nater... [et al.] |
| Resource type: reference resource |
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Subject: Weighing instruments -- Dictionaries; Weights and measures -- Dictionaries |
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 http://dx.doi.org/10.1007/978-3-642-02014-8 |
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3. A dictionary of weights, measures, and units Donald Fenna |
| Resource type: reference resource |
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Subject: Units of measurement -- Dictionaries; Measurement -- Dictionaries; Weights and measures -- Dictionaries |
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http://uclibs.org/PID/241169 |
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Antpac Record
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4. A dictionary of weights, measures, and units edited by Don Fenna |
| Resource type: reference resource |
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Subject: Units of measurement -- Dictionaries; Measurement -- Dictionaries; Weights and measures -- Dictionaries |
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http://uclibs.org/PID/37500 |
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Antpac Record
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5. IEEE standard glossary of data management terminology sponsor, Standards Coordinating Committee of the IEEE Computer Society |
| Resource type: reference resource |
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Subject: Database management -- Standards -- Glossaries, vocabularies, etc |
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http://ieeexplore.ieee.org/servlet/opac?punumber=2338 |
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Antpac Record
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6. IEEE standard glossary of image processing and pattern recognition terminology sponsor, Standards Coordinating Committee of the IEEE Computer Society |
| Resource type: reference resource |
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Subject: Pattern perception -- Dictionaries; Image processing -- Dictionaries |
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http://ieeexplore.ieee.org/servlet/opac?punumber=2339 |
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Antpac Record
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7. IEEE standard glossary of modeling and simulation terminology sponsor, Standards Coordinating Committee, of the IEEE Computer Society |
| Resource type: reference resource |
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Subject: Computer simulation -- Dictionaries |
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http://ieeexplore.ieee.org/servlet/opac?punumber=2340 |
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Antpac Record
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8. IEEE Standard radar definitions sponsor, Radar Systems Panel of the IEEE Aerospace and Electronic Systems Society |
| Resource type: reference resource |
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Subject: Radar -- Dictionaries; Radar -- Standards |
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http://ieeexplore.ieee.org/servlet/opac?punumber=2336 |
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Antpac Record
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9. International journal of metrology and quality engineering |
| Resource type: serial |
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Subject: Engineering; Metrology |
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v.1(2010)- |
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10. International journal of metrology and quality engineering |
| Resource type: full-text journal |
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Subject: Engineering; Metrology |
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v.1(2010)- |
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11. Journal of research of the National Institute of Standards and Technology |
| Resource type: serial |
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Subject: Weights and Measures; Technology; Science; Research Design; Measurement; Physical measurements; Standardization |
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v.93(1988)- |
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12. Journal of research of the National Institute of Standards and Technology |
| Resource type: full-text journal |
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Subject: Weights and Measures; Technology; Science; Research Design; Measurement; Physical measurements; Standardization |
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v.93(1988)- |
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13. Measurement: journal of the International Measurement Confederation |
| Resource type: serial |
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Subject: Measurement; Weights and measures |
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v.1(1983)-v.38(2005). |
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1995-
Freedom Collection via ScienceDirect. |
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14. Measurement: journal of the International Measurement Confederation |
| Resource type: full-text journal |
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Subject: Measurement; Weights and measures |
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v.1(1983)-v.38(2005). |
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1995-
Freedom Collection via ScienceDirect. |
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15. Metrologia |
| Resource type: serial |
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Subject: Weights and measures |
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v.1(1965)- Institute of Physics. |
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v.1(1965)-
Institute of Physics via EBSCO. |
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16. Metrologia |
| Resource type: full-text journal |
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Subject: Weights and measures |
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v.1(1965)- Institute of Physics. |
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v.1(1965)-
Institute of Physics via EBSCO. |
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17. National Semiconductor Metrology Program: [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program] |
| Resource type: serial |
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Subject: Semiconductors -- Measurement -- Bibliography -- Catalogs |
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http://purl.access.gpo.gov/GPO/LPS1622 |
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Antpac Record
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18. NIST calibration services users guide / Office of Physical Measurement Services, National Institute of Standards and Technology |
| Resource type: serial |
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Subject: Engineering instruments -- Testing -- Handbooks, manuals, etc; Physical instruments -- Testing -- Handbooks, manuals, etc; Engineering instruments -- Calibration -- Handbooks, manuals, etc; Physical instruments -- Calibration -- Handbooks, manuals, etc; P |
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Current issue: |
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19. NIST update (Online) |
| Resource type: serial |
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Subject: Standardization -- United States |
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http://purl.access.gpo.gov/GPO/LPS1836 |
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20. NIST update (Online) |
| Resource type: full-text journal |
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Subject: Standardization -- United States |
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http://purl.access.gpo.gov/GPO/LPS1836 |
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Antpac Record
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21. Specifications, tolerances, and other technical requirements for weighing and measuring devices / adopted by the National Conference on Weights and Measures |
| Resource type: serial |
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Subject: Weighing instruments -- United States; Scales (Weighing instruments) -- United States |
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http://purl.access.gpo.gov/GPO/LPS26523 |
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Antpac Record
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22. Wgelexikon Leitfaden wgetechnischer Begriffe / Roland Nater ... [et al.] |
| Resource type: reference resource |
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Subject: Metrology -- Testing -- Encyclopedias; Weights and measures -- Testing -- Encyclopedias; Metrology -- Encyclopedias; Weights and measures -- Encyclopedias |
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http://dx.doi.org/10.1007/978-3-540-75908-9 |
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Antpac Record
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